test - semiconductor - BUSINESS - NEPES

TEST

We provide a Test Solution specializing in highly functional system semiconductor used
for cutting-edge IT devices with global top-level competitiveness in test services.

TEST Solutions

Pad Test
Bumping
Wafer Test
Assembly
Final Test
Final Product

Application & Portfolio

SYSTEM IC
MCU SoC DSP, ISP AI Custom IC Audio
PMIC (Power Management IC)
Mobile Phone LED Lighting Automotive Battery Charger SSD
RF
Wireless Transceiver 5G RF
DDI (Display Driver IC)
Monitor,
Laptop PC Mobile Phone,
Tablet PC LCD/OLED TV Automotive Display Panel
CIS(CMOS Image Sensor)
Mobile Phone Laptop PC, Tablet PC Black Box Security Automotive
IoT & Sensor
Controller Memory Touch Sensor Security MCU

Product View

Application	Tester		Main Specification
Application	Model	Maker	Main Specification
CIS	T2000 ISS	Advantest	1Gbps 4.8GICAP, IPE3
RF	V93000	Advantest	533Mbps (up to 1.6Gbps by license option) WSMX, WSPS, WSRF, RFIM6/18
Power Logic Analog Mixed SOC	i-Flex	Teradyne	200Mhz VHFAC, BBAC
	T2000 IPS	Advantest	250Mbps, 500Mbps (up to 1.0Gbps by license option) GPWGD(24bit), AMO(24bit), GPWGD+AMO(32bit)
	ETS600	Teradyne	66Mhz/133Mbps
	Ultra-Flex	Teradyne	100Mbps (up to 1.6Gbps by license option) UltraPAC80, UltraWave24
DDI	ST670 ST6730/A	Yokogawa	200Mhz VHFAC, BBAC
	T6372(ND2) T6373(ND3)	Advantest	875Mbps(DIO) 875Mbps(DIO) / 2.5Gbps(HSIF)
	T6391(ND4)	Advantest	1.1Gbps(DIO) / 4.0Gbps(UHSIF)

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TEST Total Solution Provider

Test Program Development
Wafer Probe Test
Probe card, PIB Development & Maintenance
Package Final Test
Intelligent IT system Infra support
Turn-key service(BUMP – TEST – PACKAGE)
System U/I Development

nepes Ark

Address587-32 Gwahaksaneop 2-ro Ochang-eup, Cheongwon-gu, Cheongju-si, Chungcheongbuk-do

Tel+82-43-240-0500 (Line 3)

E-mailsales@nepes.co.kr

Website